IEEE - Institute of Electrical and Electronics Engineers, Inc. - Assessment of accuracy for urban classified raster map analysis

2009 Joint Urban Remote Sensing Event

Author(s): Xiankun Yang ; Fengrui Chen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Shanghai, China, China
Conference Date: 20 May 2009
Page(s): 1 - 7
ISBN (CD): 978-1-4244-3461-9
ISBN (Paper): 978-1-4244-3460-2
DOI: 10.1109/URS.2009.5137634
Regular:

The rapid growth of urban space and its environmental challenges require precise mapping techniques to represent complex earth surface features more accurately. In this study, we examined four... View More

Advertisement