IEEE - Institute of Electrical and Electronics Engineers, Inc. - Synthetic analysis of urban landscape pattern and environmental impact based on Remote Sensing

2009 Joint Urban Remote Sensing Event

Author(s): Pan Chen ; Du Peijun ; Lin Yi ; Chen Yingying
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Shanghai, China, China
Conference Date: 20 May 2009
Page(s): 1 - 7
ISBN (CD): 978-1-4244-3461-9
ISBN (Paper): 978-1-4244-3460-2
DOI: 10.1109/URS.2009.5137504
Regular:

Taking Xuzhou City as a case, the studies of landscape classification, pattern analysis and eco-environmental impacts evaluation are made using Landsat TM/ETM+ images in this paper. For this... View More

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