IEEE - Institute of Electrical and Electronics Engineers, Inc. - The urban heat island in Hong Kong: Causative factors and scenario analysis

2009 Joint Urban Remote Sensing Event

Author(s): Man Sing Wong ; Nichol, J. ; Ka Hei Kwok
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Shanghai, China, China
Conference Date: 20 May 2009
Page(s): 1 - 7
ISBN (CD): 978-1-4244-3461-9
ISBN (Paper): 978-1-4244-3460-2
DOI: 10.1109/URS.2009.5137468
Regular:

Although many methods for heat island study have been developed, there is little attempt to link the findings to actual and hypothetical scenarios of urban developments which would help to... View More

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