IEEE - Institute of Electrical and Electronics Engineers, Inc. - Research and development of fast field tester for characteristics of solar array

2009 Canadian Conference on Electrical and Computer Engineering (CCECE)

Author(s): Mao Meiqin ; Su Jianhui ; Liuchen Chang ; Peng Kai ; Zhang Guorong ; Ding Ming
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: St. John's, NL, Canada, Canada
Conference Date: 3 May 2009
Page(s): 1,055 - 1,060
ISBN (CD): 978-1-4244-3508-1
ISBN (Paper): 978-1-4244-3509-8
ISSN (Paper): 0840-7789
DOI: 10.1109/CCECE.2009.5090290
Regular:

I-V characteristic of a solar array is very important for the design and long-term performance evaluation of a photovoltaic (PV) generation system. Manufacturers provide only I-V characteristic of... View More

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