IEEE - Institute of Electrical and Electronics Engineers, Inc. - Framework for extending plagiarism detection in virtual worlds

2009 Third International Conference on Research Challenges in Information Science (RCIS)

Author(s): Zaka, B. ; Steurer, M. ; Kappe, F.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2009
Conference Location: Fez, Morocco, Morocco
Conference Date: 22 April 2009
Page(s): 59 - 66
ISBN (CD): 978-1-4244-2865-6
ISBN (Paper): 978-1-4244-2864-9
DOI: 10.1109/RCIS.2009.5089268
Regular:

The economies of virtual worlds are driven by the exchange of virtual good and services. These goods are available in the form of image textures, 3D objects, and scripts. The theft or unauthorized... View More

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