IEEE - Institute of Electrical and Electronics Engineers, Inc. - 3D object shape and reflectance property reconstruction using image scanner

2009 IEEE International Workshop on Imaging Systems and Techniques (IST)

Author(s): Ukida, H. ; Tanimoto, Y. ; Sano, T. ; Yamamoto, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2009
Conference Location: Shenzhen, China, China
Conference Date: 11 May 2009
Page(s): 94 - 99
ISBN (CD): 978-1-4244-3483-1
ISBN (Paper): 978-1-4244-3482-4
DOI: 10.1109/IST.2009.5071610
Regular:

This study proposes a method to recover 3D shape, color and specular reflections of an object from images taken by an image scanner which has multiple illuminations. The proposed method is... View More

Advertisement