IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Memory Built-In Self-Test Architecture for Memories Different in Size

2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis

Author(s): Quan-Lin Rao ; Chun He ; Yu-Ming Jia
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2009
Conference Location: Chengdu , China, China
Conference Date: 28 April 2009
Page(s): 1 - 4
ISBN (Paper): 978-1-4244-2587-7
DOI: 10.1109/CAS-ICTD.2009.4960752
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