IEEE - Institute of Electrical and Electronics Engineers, Inc. - Universal test system architecture in mechatronics - An approach for systematization of today's existing test tools

2009 IEEE International Conference on Industrial Technology - (ICIT)

Author(s): Korotkiy, D. ; Dettmering, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2009
Conference Location: Churchill, Victoria, Australia, Australia
Conference Date: 10 February 2009
Page(s): 1 - 5
ISBN (CD): 978-1-4244-3507-4
ISBN (Paper): 978-1-4244-3506-7
DOI: 10.1109/ICIT.2009.4939560
Regular:

In this paper an universal architecture for test systems is presented, which can be used as basis for systematization of today's existing test tools during all stages of the development process in... View More

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