IEEE - Institute of Electrical and Electronics Engineers, Inc. - Problems of Yield Gradient Estimation for Truncated Probability Density Functions

Author(s): M.A. Styblinski
Sponsor(s): IEEE Council on Electronic Design Automation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1986
Volume: 5
Page(s): 30 - 38
ISSN (Paper): 0278-0070
ISSN (Online): 1937-4151
DOI: 10.1109/TCAD.1986.1270175
Regular:

In this paper theoretical possibilities of statistical yield gradient estimation are discussed for those cases where circuit element probability density functions are truncated or... View More

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