IEEE - Institute of Electrical and Electronics Engineers, Inc. - An efficient reliability evaluation approach for system-level design of embedded systems

2009 10th International Symposium on Quality Electronic Design (ISQED)

Author(s): Israr, A. ; Shoufan, A. ; Huss, S.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2009
Conference Location: San Jose, CA, USA, USA
Conference Date: 16 March 2009
Page(s): 339 - 344
ISBN (CD): 978-1-4244-2953-0
ISBN (Paper): 978-1-4244-2952-3
DOI: 10.1109/ISQED.2009.4810317
Regular:

A system-level design process of reliable systems demands efficient reliability evaluation of the explored design alternatives. This paper presents a new approach to accelerate the reliability... View More

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