IEEE - Institute of Electrical and Electronics Engineers, Inc. - Variability-aware robust design space exploration of chip multiprocessor architectures

2009 Asia and South Pacific Design Automation Conference (ASP-DAC)

Author(s): Palermo, G. ; Silvano, C. ; Zaccaria, V.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2009
Conference Location: Yokohama, Japan, Japan
Conference Date: 19 January 2009
Page(s): 323 - 328
ISBN (CD): 978-1-4244-2749-9
ISBN (Paper): 978-1-4244-2748-2
DOI: 10.1109/ASPDAC.2009.4796501
Regular:

In the context of a design space exploration framework for supporting the platform-based design approach, we address the problem of robustness with respect to manufacturing process variations.... View More

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