IEEE - Institute of Electrical and Electronics Engineers, Inc. - Aircraft micro-Doppler feature extraction from high range resolution profiles

2015 IEEE Radar Conference

Author(s): R. J. Berndt
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2015
Conference Location: Johannesburg, South Africa
Conference Date: 27 October 2015
Page(s): 457 - 462
ISBN (Electronic): 978-1-4673-9655-4
ISBN (USB): 978-1-4673-9654-7
DOI: 10.1109/RadarConf.2015.7411927
Regular:

The use of high range resolution measurements and the micro-Doppler effect produced by rotating or vibrating parts of a target has been well documented. This paper presents a technique for... View More

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