IEEE - Institute of Electrical and Electronics Engineers, Inc. - Benefits of Integrated-Circuit Burn-In to Obtain High Reliability Parts

Author(s): Dragan Pantic
Sponsor(s): IEEE Reliability Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 1986
Volume: 35
Page(s): 3 - 6
ISSN (Paper): 0018-9529
ISSN (Online): 1558-1721
DOI: 10.1109/TR.1986.4335327
Regular:

The technique of integrated circuit (IC) burn-in is applied industry-wide with the assumption that burned-in ICs have a much lower failure rate during operating life than ICs which are not... View More

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