IEEE - Institute of Electrical and Electronics Engineers, Inc. - Observability solutions for in-field functional test of processor-based systems

2015 Conference on Design of Circuits and Integrated Systems (DCIS)

Author(s): J. Perez Acle ; R. Cantoro ; A. T. Hailemichael ; E. Sanchez ; M. Sonza Reorda
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2015
Conference Location: Estoril, Portugal
Conference Date: 25 November 2015
Page(s): 1 - 6
ISBN (Electronic): 978-1-4673-7228-2
ISBN (USB): 978-1-4673-7227-5
DOI: 10.1109/DCIS.2015.7388582
Regular:

The growing usage of electronic systems in safety-critical applications requires effective solutions to early identify possible faults affecting the hardware while it is in the operational phase.... View More

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