IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dynamic risk evaluation model as a security field

2015 IEEE 4th Global Conference on Consumer Electronics (GCCE)

Author(s): Masahiko Shimazu ; Atsushi Kanai ; Shigeki Tanimoto ; Hiroyuki Sato
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2015
Conference Location: Osaka, Japan
Conference Date: 27 October 2015
Page(s): 628 - 629
ISBN (Electronic): 978-1-4799-8751-1
ISBN (USB): 978-1-4799-8750-4
DOI: 10.1109/GCCE.2015.7398641
Regular:

Generally, high security information management leads to high confidentiality. However, high confidentiality causes low availability. Therefore, we think availability can be increased by choosing... View More

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