IEEE - Institute of Electrical and Electronics Engineers, Inc. - WAP: Digital dependability identities

2015 IEEE 26th International Symposium on Software Reliability Engineering (ISSRE)

Author(s): Daniel Schneider ; Mario Trapp ; Yiannis Papadopoulos ; Eric Armengaud ; Marc Zeller ; Kai Hofig
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2015
Conference Location: Gaithersbury, MD, USA
Conference Date: 2 November 2015
Page(s): 324 - 329
ISBN (CD): 978-1-5090-0405-8
ISBN (Electronic): 978-1-5090-0406-5
DOI: 10.1109/ISSRE.2015.7381825
Regular:

Cyber-Physical Systems (CPS) provide enormous potential for innovation but a precondition for this is that the issue of dependability has been addressed. This paper presents the concept of a... View More

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