IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Data Driven Approach to Uncover Deficiencies in Online Reputation Systems

2015 IEEE International Conference on Data Mining (ICDM)

Author(s): Hong Xie ; John C. S. Lui
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2015
Conference Location: Atlantic City, NJ, USA
Conference Date: 14 November 2015
Page(s): 1,045 - 1,050
ISBN (CD): 978-1-4673-9503-8
ISBN (Electronic): 978-1-4673-9504-5
ISSN (Paper): 1550-4786
DOI: 10.1109/ICDM.2015.30
Regular:

Online reputation systems serve as core building blocks in various Internet services such as E-commerce (e.g. eBay) and crowdsourcing (e.g., oDesk). The flaws of real-world online reputation... View More

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