IEEE - Institute of Electrical and Electronics Engineers, Inc. - Detection of line scratch using energy regularity of spatio-temporal video cube

2015 International Conference on Image Processing Theory, Tools and Applications (IPTA)

Author(s): Rupesh Kumar ; Sumana Gupta ; K. S. Venkatesh
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2015
Conference Location: Orleans, France
Conference Date: 10 November 2015
Page(s): 360 - 364
ISBN (Electronic): 978-1-4799-8637-8
ISBN (USB): 978-1-4799-8635-4
ISBN (Paper): 978-1-4799-8636-1
ISSN (Electronic): 2154-512X
DOI: 10.1109/IPTA.2015.7367166
Regular:

Scratch is the most dominant defect in an old age video film and its most common form is the vertical line scratch. Restoration of video film corrupted by these defects is totally depends on their... View More

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