IEEE - Institute of Electrical and Electronics Engineers, Inc. - Research on accident process meta-modeling based on SysML

2015 First International Conference on Reliability Systems Engineering (ICRSE)

Author(s): Qianxin Wei ; Jian Jiao ; Shanshan Zhou ; Tingdi Zhao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2015
Conference Location: Beijing, China
Conference Date: 21 October 2015
Page(s): 1 - 6
ISBN (Electronic): 978-1-4673-8557-2
ISBN (USB): 978-1-4673-8556-5
DOI: 10.1109/ICRSE.2015.7366487
Regular:

Based on the situation that faults cause hazard in complex equipment system, an accident process meta-model is proposed based on the meta-model theory. The meta-model of the accident process is... View More

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