IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault propagation formal modeling based on stateflow

2015 First International Conference on Reliability Systems Engineering (ICRSE)

Author(s): Lu Chen ; Jian Jiao ; Jiping Fan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2015
Conference Location: Beijing, China
Conference Date: 21 October 2015
Page(s): 1 - 7
ISBN (Electronic): 978-1-4673-8557-2
ISBN (USB): 978-1-4673-8556-5
DOI: 10.1109/ICRSE.2015.7366480
Regular:

In order to specify the description of accident process and structure the general formal model, this paper abstracted and defined some correlate concepts of fault propagation process, and carried... View More

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