IEEE - Institute of Electrical and Electronics Engineers, Inc. - A 3-D model-based approach for key failures control of multi-layer product

2015 First International Conference on Reliability Systems Engineering (ICRSE)

Author(s): Dezhen Yang ; Yi Ren ; Zili Wang ; Jian Fan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2015
Conference Location: Beijing, China
Conference Date: 21 October 2015
Page(s): 1 - 6
ISBN (Electronic): 978-1-4673-8557-2
ISBN (USB): 978-1-4673-8556-5
DOI: 10.1109/ICRSE.2015.7366473
Regular:

Traditional failure analysis results are mostly in text/graphics/tabular form, which brings challenges to intuitional and quick reliability design evaluation, and makes it difficult to... View More

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