IEEE - Institute of Electrical and Electronics Engineers, Inc. - Research on application of functional FMECA in reverse engineering optimization

2015 First International Conference on Reliability Systems Engineering (ICRSE)

Author(s): Wenjin Zhang ; Kun Wang ; Jie Meng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2015
Conference Location: Beijing, China
Conference Date: 21 October 2015
Page(s): 1 - 5
ISBN (Electronic): 978-1-4673-8557-2
ISBN (USB): 978-1-4673-8556-5
DOI: 10.1109/ICRSE.2015.7366458
Regular:

This paper studies how to apply the functional FMECA-a reliability analysis method in the reverse engineering process to make up for the shortcomings in reliability design. Analyze the... View More

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