IEEE - Institute of Electrical and Electronics Engineers, Inc. - Rapid assessment of system-of-systems(SoS) mission reliability based on Markov chains

2015 First International Conference on Reliability Systems Engineering (ICRSE)

Author(s): Yun Huang ; Xing Pan ; Lunhu Hu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2015
Conference Location: Beijing, China
Conference Date: 21 October 2015
Page(s): 1 - 6
ISBN (Electronic): 978-1-4673-8557-2
ISBN (USB): 978-1-4673-8556-5
DOI: 10.1109/ICRSE.2015.7366452
Regular:

Traditional reliability analysis methods can't perform well when applied to evaluating system-of-systems (SoS) reliability due to SoS's complexity of constituent systems and evolvability of its... View More

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