IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliability assessment for nonlinear degradation data with individual variation

2015 First International Conference on Reliability Systems Engineering (ICRSE)

Author(s): Zhongyi Cai ; Yunxiang Chen ; ZeZhou Wang ; Chengkun Luo
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2015
Conference Location: Beijing, China
Conference Date: 21 October 2015
Page(s): 1 - 5
ISBN (Electronic): 978-1-4673-8557-2
ISBN (USB): 978-1-4673-8556-5
DOI: 10.1109/ICRSE.2015.7366450
Regular:

Aiming at nonlinear degradation data on occasion of Constant-Stress Accelerated Degradation Test (CSADT), a reliability assessment method of nonlinear accelerated degradation based on Wiener... View More

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