IEEE - Institute of Electrical and Electronics Engineers, Inc. - A formal approach to causal analysis based on STAMP (CAST)

2015 First International Conference on Reliability Systems Engineering (ICRSE)

Author(s): Qibo Yang ; Jin Tian
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2015
Conference Location: Beijing, China
Conference Date: 21 October 2015
Page(s): 1 - 8
ISBN (Electronic): 978-1-4673-8557-2
ISBN (USB): 978-1-4673-8556-5
DOI: 10.1109/ICRSE.2015.7366434
Regular:

In the context that major accidents are mostly in consequence of complex factors interact with each other and the traditional accident analysis methods are no longer adequate to the modern complex... View More

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