IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Bayesian life test sampling plan for a weibull lifetime distribution under accelerated type-I censoring

2015 First International Conference on Reliability Systems Engineering (ICRSE)

Author(s): Renqing Li ; Xiaoyang Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2015
Conference Location: Beijing, China
Conference Date: 21 October 2015
Page(s): 1 - 7
ISBN (Electronic): 978-1-4673-8557-2
ISBN (USB): 978-1-4673-8556-5
DOI: 10.1109/ICRSE.2015.7366407
Regular:

A life test sampling plan under accelerated condition is an efficient approach in reliability demonstration, especially for the products with high reliability and long life. It pays more attention... View More

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