IEEE - Institute of Electrical and Electronics Engineers, Inc. - A proposal for updating the standard IEC-61123 - compliance test plans for success ratio

2015 IEEE International Conference on Microwaves, Communications, Antennas and Electronic Systems (COMCAS)

Author(s): Ofer Shaham ; Yefim Haim Michlin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2015
Conference Location: Tel-Aviv, Israel
Conference Date: 2 November 2015
Page(s): 1 - 3
ISBN (Electronic): 978-1-4799-7473-3
ISBN (USB): 978-1-4799-7472-6
DOI: 10.1109/COMCAS.2015.7360420
Regular:

An improvement of IEC-61123 in the field of sequential probability ratio test (SPRT) is proposed. The current standard does not provide a proper solution for modern industry's needs, and the test... View More

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