IEEE - Institute of Electrical and Electronics Engineers, Inc. - Echo State Network with SVM-readout for customer churn prediction

2015 IEEE Jordan Conference on Applied Electrical Engineering and Computing Technologies (AEECT)

Author(s): Ali Rodan ; Hossam Faris
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2015
Conference Location: Amman, Jordan
Conference Date: 3 November 2015
Page(s): 1 - 5
ISBN (Electronic): 978-1-4799-7431-3
ISBN (USB): 978-1-4799-7430-6
ISBN (Paper): 978-1-4799-7442-9
DOI: 10.1109/AEECT.2015.7360579
Regular:

In all customer based industries, customer churn is considered as one of the most important and challenging concerns since it can lead to a serious profit loss. Therefore, developing accurate... View More

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