IEEE - Institute of Electrical and Electronics Engineers, Inc. - Order Graphs and Cross-Layer Parametric Significance-Driven Modelling

2015 15th International Conference on Application of Concurrency to System Design (ACSD)

Author(s): A. Rafiev ; F. Xia ; A. Iliasov ; R. Gensh ; A. Aalsaud ; Alexander Romanovsky ; Alex Yakovlev
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2015
Conference Location: Brussels, Belgium
Conference Date: 21 June 2015
Page(s): 110 - 119
ISBN (Electronic): 978-1-4673-7882-6
ISSN (Electronic): 1550-4808
DOI: 10.1109/ACSD.2015.16
Regular:

Traditional hierarchical modelling methods tend to have layers of abstraction corresponding to naturally existing layers of concern in multi-level systems. Although logically and functionally... View More

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