IEEE - Institute of Electrical and Electronics Engineers, Inc. - Empowering test engineering

2015 IEEE AUTOTESTCON

Author(s): Louis Y. Ungar
Sponsor(s): IEEE Instrum. Meas. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 November 2015
Conference Location: National Harbor, MD, USA
Conference Date: 2 November 2015
Page(s): 316 - 323
ISBN (CD): 978-1-4799-8189-2
ISBN (Electronic): 978-1-4799-8190-8
DOI: 10.1109/AUTEST.2015.7356509
Regular:

While test engineering has been busy creating better and more comprehensive tests in response to an ever more complex set of electronics, its status as a profession has steadily declined. The... View More

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