IEEE - Institute of Electrical and Electronics Engineers, Inc. - Toward big data risk analysis

2015 IEEE International Conference on Big Data (Big Data)

Author(s): Ernesto Damiani
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2015
Conference Location: Santa Clara, CA, USA
Conference Date: 29 October 2015
Page(s): 1,905 - 1,909
ISBN (Electronic): 978-1-4799-9926-2
ISBN (USB): 978-1-4799-9925-5
DOI: 10.1109/BigData.2015.7363966
Regular:

The advent of social networks and Internet-of-Things has resulted in unprecedented capability of collecting, sharing and analyzing massive amounts of data. From a security perspective, Big Data... View More

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