IEEE - Institute of Electrical and Electronics Engineers, Inc. - Methods for analysing and improving the fault resilience of delay-insensitive codes

2015 33rd IEEE International Conference on Computer Design (ICCD)

Author(s): Jakob Lechner ; Andreas Steininger ; Florian Huemer
Sponsor(s): IEEE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2015
Conference Location: New York, NY, USA
Conference Date: 18 October 2015
Page(s): 519 - 526
ISBN (Electronic): 978-1-4673-7166-7
ISBN (USB): 978-1-4673-7165-0
DOI: 10.1109/ICCD.2015.7357160
Regular:

Delay-insensitive (DI) codes are usually prone to transient faults occurring during an ongoing transmission. For most DI codewords even a single transient can turn an incomplete transmission into... View More

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