IEEE - Institute of Electrical and Electronics Engineers, Inc. - An exploratory study about the cross-project defect prediction: Impact of using different classification algorithms and a measure of performance in building predictive models

2015 XLI Latin American Computing Conference (CLEI)

Author(s): Ricardo F. P. Satin ; Igor Scaliante Wiese ; Reginaldo Re
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2015
Conference Location: Arequipa, Peru
Conference Date: 19 October 2015
Page(s): 1 - 12
ISBN (Electronic): 978-1-4673-9143-6
ISBN (USB): 978-1-4673-9142-9
DOI: 10.1109/CLEI.2015.7360033
Regular:

Predicting defects in software projects is a complex task, especially in the initial phases of software development because there are a few available data. The use of cross-project defect... View More

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