IEEE - Institute of Electrical and Electronics Engineers, Inc. - Natural contamination deposition characteristics based on Natural Contamination Testing Station

2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)

Author(s): Hongchuan Dong ; Wenjie Xu ; Bin Cao ; Liming Wang ; Zhicheng Guan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2015
Conference Location: Ann Arbor, MI, USA
Conference Date: 18 October 2015
Page(s): 403 - 406
ISBN (Electronic): 978-1-4673-7498-9
ISBN (USB): 978-1-4673-7497-2
ISBN (Paper): 978-1-4673-7496-5
DOI: 10.1109/CEIDP.2015.7352055
Regular:

At the Kunming Natural Contamination Testing Station we chose the common Porcelain insulator, Glass insulator and Composite insulator to study the natural characteristics of insulators... View More

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