IEEE - Institute of Electrical and Electronics Engineers, Inc. - The equivalent dissolved salt deposit density of contamination on surface of silicone rubber

2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)

Author(s): Bin Cao ; Hongwei Mei ; Liming Wang ; Xiangyun Fu ; Zhifu Zhang ; He Gao ; Xiangjun Lin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2015
Conference Location: Ann Arbor, MI, USA
Conference Date: 18 October 2015
Page(s): 676 - 679
ISBN (Electronic): 978-1-4673-7498-9
ISBN (USB): 978-1-4673-7497-2
ISBN (Paper): 978-1-4673-7496-5
DOI: 10.1109/CEIDP.2015.7352051
Regular:

The equivalent salt deposit density (ESDD) is one of the appropriate parameters to describe the level of contamination on the surface of insulator. Because of the unique properties of silicone... View More

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