IEEE - Institute of Electrical and Electronics Engineers, Inc. - VAST Challenge 2015: Mayhem at dinofun world

2015 IEEE Conference on Visual Analytics Science and Technology (VAST)

Author(s): Mark Whiting ; Kristin Cook ; Georges Grinstein ; John Fallon ; Kristen Liggett ; Diane Staheli ; Jordan Crouser
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2015
Conference Location: Chicago, IL, USA
Conference Date: 25 October 2015
Page(s): 113 - 118
ISBN (Electronic): 978-1-4673-9783-4
DOI: 10.1109/VAST.2015.7347638
Regular:

A fictitious amusement park and a larger-than-life hometown football hero provided participants in the VAST Challenge 2015 with an engaging yet complex storyline and setting in which to analyze... View More

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