IEEE - Institute of Electrical and Electronics Engineers, Inc. - Collaborative visual analysis with RCloud

2015 IEEE Conference on Visual Analytics Science and Technology (VAST)

Author(s): Stephen North ; Carlos Scheidegger ; Simon Urbanek ; Gordon Woodhull
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2015
Conference Location: Chicago, IL, USA
Conference Date: 25 October 2015
Page(s): 25 - 32
ISBN (Electronic): 978-1-4673-9783-4
DOI: 10.1109/VAST.2015.7347627
Regular:

Consider the emerging role of data science teams embedded in larger organizations. Individual analysts work on loosely related problems, and must share their findings with each other and the... View More

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