IEEE - Institute of Electrical and Electronics Engineers, Inc. - Device failure detection algorithm over MAC for radio resource efficiency based on IEEE 802.15.4

2015 International Conference on Information and Communication Technology Convergence (ICTC)

Author(s): Sun-Hwa Lim ; Young-il Kim ; Yong-Tae Lee
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2015
Conference Location: Jeju, South Korea
Conference Date: 28 October 2015
Page(s): 884 - 887
ISBN (Electronic): 978-1-4673-7116-2
ISBN (USB): 978-1-4673-7115-5
DOI: 10.1109/ICTC.2015.7354692
Regular:

A lot of research have been done in wireless sensor networks (WSNs) based on IEEE 802.15.4. However, there is no study that the status of a device is monitored by the PAN coordinator in the IEEE... View More

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