IEEE - Institute of Electrical and Electronics Engineers, Inc. - Arc-fault unwanted tripping survey with UL 1699B-listed products

2015 IEEE 42nd Photovoltaic Specialists Conference (PVSC)

Author(s): Jay Johnson ; Kenneth M. Armijo ; Modi Avrutsky ; Daniel Eizips ; Sergey Kondrashov
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2015
Conference Location: New Orleans, LA, USA
Conference Date: 14 June 2015
Page(s): 1 - 6
ISBN (Electronic): 978-1-4799-7944-8
ISBN (DVD): 978-1-4799-7943-1
DOI: 10.1109/PVSC.2015.7356427
Regular:

Since adoption of the 2011 National Electrical CodeĀ®, many photovoltaic (PV) direct current (DC) arc-fault circuit interrupters (AFCIs) and arc-fault detectors (AFDs) have been introduced into the... View More

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