IEEE - Institute of Electrical and Electronics Engineers, Inc. - Assessing the accuracy of imaging techniques for defect characterization on thin film solar cells

2015 IEEE 42nd Photovoltaic Specialists Conference (PVSC)

Author(s): Andreas Vetter ; Bernhard Hofbeck ; Peter Kubis ; Christoph J. Brabec
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2015
Conference Location: New Orleans, LA, USA
Conference Date: 14 June 2015
Page(s): 1 - 3
ISBN (Electronic): 978-1-4799-7944-8
ISBN (DVD): 978-1-4799-7943-1
DOI: 10.1109/PVSC.2015.7356385
Regular:

Imaging methods are an essential tool for improving processing of solar cells. Unfortunately, it is difficult to validate the imaging methods in detail. One focus of our work was to establish an... View More

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