IEEE - Institute of Electrical and Electronics Engineers, Inc. - Implementation of printed-AlOx PERC technology on multi-crystalline silicon solar cells: Impact of wafer quality

2015 IEEE 42nd Photovoltaic Specialists Conference (PVSC)

Author(s): Tsung-Cheng Chen ; Chen-Hao Ku ; Yung-Sheng Lin ; Cheng-Shun Hu ; Ching-Chang Wen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2015
Conference Location: New Orleans, LA, USA
Conference Date: 14 June 2015
Page(s): 1 - 3
ISBN (Electronic): 978-1-4799-7944-8
ISBN (DVD): 978-1-4799-7943-1
DOI: 10.1109/PVSC.2015.7356332
Regular:

In this paper we implement our newly developed printed-AlOx PERC technology (ExcelTon™-III) on multi-crystalline silicon (mc-Si) solar cells. Using the ExcelTon™-III technology,... View More

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