IEEE - Institute of Electrical and Electronics Engineers, Inc. - Native oxide and optical constant determination of InP lattice-matched quaternary materials using variable angle spectroscopic ellipsometry

2015 IEEE 42nd Photovoltaic Specialists Conference (PVSC)

Author(s): Nicole A. Kotulak ; Matthew P. Lumb ; Michael K. Yakes ; Kenneth J. Schmieder ; Maria Gonzalez ; Chris Ebert ; Robert J. Walters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2015
Conference Location: New Orleans, LA, USA
Conference Date: 14 June 2015
Page(s): 1 - 4
ISBN (Electronic): 978-1-4799-7944-8
ISBN (DVD): 978-1-4799-7943-1
DOI: 10.1109/PVSC.2015.7356080
Regular:

Quaternary materials lattice-matched to InP have been examined using variable angle spectroscopic ellipsometry (VASE). The optical constants of InGaAsP and InAlGaAs, lattice-matched to InP with... View More

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