IEEE - Institute of Electrical and Electronics Engineers, Inc. - Rapid, enhanced IV characterization of multi-junction PV devices under one sun at NREL

2015 IEEE 42nd Photovoltaic Specialists Conference (PVSC)

Author(s): Tom Moriarty ; Ryan France ; Myles Steiner
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2015
Conference Location: New Orleans, LA, USA
Conference Date: 14 June 2015
Page(s): 1 - 3
ISBN (Electronic): 978-1-4799-7944-8
ISBN (DVD): 978-1-4799-7943-1
DOI: 10.1109/PVSC.2015.7355845
Regular:

Multi-junction technology is rapidly advancing, which puts increasing demands on IV characterization resources. We report on a tool and procedure for fast turn-around of IV data under the... View More

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