IEEE - Institute of Electrical and Electronics Engineers, Inc. - Quantum efficiency loss after PID stress: Wavelength dependence on cell surface and cell edge

2015 IEEE 42nd Photovoltaic Specialists Conference (PVSC)

Author(s): Jaewon Oh ; Stuart Bowden ; GovindaSamy TamizhMani ; Peter Hacke
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2015
Conference Location: New Orleans, LA, USA
Conference Date: 14 June 2015
Page(s): 1 - 4
ISBN (Electronic): 978-1-4799-7944-8
ISBN (DVD): 978-1-4799-7943-1
DOI: 10.1109/PVSC.2015.7355629
Regular:

It is known that the potential induced degradation (PID) stress of conventional p-base solar cells affects power, shunt resistance, junction recombination, and quantum efficiency (QE). One of the... View More

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