IEEE - Institute of Electrical and Electronics Engineers, Inc. - Characterization of surface potential and capacitance on CdS/Cu(In,Ga)Se2 multi-layers by KFM and EFM

2015 IEEE 42nd Photovoltaic Specialists Conference (PVSC)

Author(s): T. Ishii ; T. Minemoto ; T. Takahashi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2015
Conference Location: New Orleans, LA, USA
Conference Date: 14 June 2015
Page(s): 1 - 3
ISBN (Electronic): 978-1-4799-7944-8
ISBN (DVD): 978-1-4799-7943-1
DOI: 10.1109/PVSC.2015.7355594
Regular:

Kelvin probe force microscopy (KFM) and electrostatic force microscopy (EFM) have been performed to investigate surface potential and depletion capacitance distribution on... View More

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