IEEE - Institute of Electrical and Electronics Engineers, Inc. - Radiation Test Results for Common CubeSat Microcontrollers and Microprocessors

2015 IEEE Radiation Effects Data Workshop (REDW)

Author(s): Steven M. Guertin ; Mehran Amrbar ; Sergeh Vartanian
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2015
Conference Location: Boston, MA, USA
Conference Date: 13 July 2015
Page(s): 1 - 9
ISBN (Paper): 978-1-4673-7641-9
DOI: 10.1109/REDW.2015.7336730
Regular:

SEL, SEU, and TID results are presented for microcontrollers and microprocessors of interest for small satellite systems such as the TI MSP430F1611, MSP430F1612 and MSP430FR5739, Microchip... View More

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