IEEE - Institute of Electrical and Electronics Engineers, Inc. - Compendium of Current Single Event Effects for Candidate Spacecraft Electronics for NASA

2015 IEEE Radiation Effects Data Workshop (REDW)

Author(s): Martha V. O'Bryan ; Kenneth A. LaBel ; Dakai Chen ; Michael J. Campola ; Megan C. Casey ; Jean Marie Lauenstein ; Jonathan A. Pellish ; Raymond L. Ladbury ; Melanie D. Berg
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2015
Conference Location: Boston, MA, USA
Conference Date: 13 July 2015
Page(s): 1 - 9
ISBN (Paper): 978-1-4673-7641-9
DOI: 10.1109/REDW.2015.7336704
Regular:

We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.

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