IEEE - Institute of Electrical and Electronics Engineers, Inc. - DRS: A Developer Risk Metric for Better Predicting Software Fault-Proneness

2015 Second International Conference on Trustworthy Systems and their Applications (TSA)

Author(s): Shou-Yu Lee ; Yihao Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2015
Conference Location: Hualien, Taiwan
Conference Date: 8 July 2015
Page(s): 120 - 127
ISBN (CD): 978-1-4673-9580-9
ISBN (Electronic): 978-1-4673-9581-6
DOI: 10.1109/TSA.2015.27
Regular:

Previous studies have reported that the performance of a developer can greatly impact the quality of the software he/she has worked on. Such performance can be measured using two developer risk... View More

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