IEEE - Institute of Electrical and Electronics Engineers, Inc. - Approximate 3D Partial Symmetry Detection Using Co-occurrence Analysis

2015 International Conference on 3D Vision (3DV)

Author(s): Chuan Li ; Michael Wand ; Xiaokun Wu ; Hans-Peter Seidel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2015
Conference Location: Lyon, France
Conference Date: 19 October 2015
Page(s): 425 - 433
ISBN (Electronic): 978-1-4673-8332-5
ISBN (USB): 978-1-4673-8331-8
DOI: 10.1109/3DV.2015.55
Regular:

This paper addresses approximate partial symmetry detection in 3D point clouds, a classical and foundational tool for analyzing geometry. We present a novel, fully unsupervised method that detects... View More

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