IEEE - Institute of Electrical and Electronics Engineers, Inc. - A 3D Scene Analysis Framework and Descriptors for Risk Evaluation

2015 International Conference on 3D Vision (3DV)

Author(s): R. Dupre ; V. Argyriou ; D. Greenhill ; G. Tzimiropoulos
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2015
Conference Location: Lyon, France
Conference Date: 19 October 2015
Page(s): 100 - 108
ISBN (Electronic): 978-1-4673-8332-5
ISBN (USB): 978-1-4673-8331-8
DOI: 10.1109/3DV.2015.19
Regular:

In this paper we evaluate the notion of scene analysis with regard to risk. We consider the problem of evaluating risk and potential hazards in an environment and providing a quantified risk... View More

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